Language	Label	Description	Alias
English	Characterization Instrument	ARIM instrument classification	-
Japanese	計測装置	先端RI(ARIM)装置分類	-

Language	English
Label	Characterization Instrument
Description	ARIM instrument classification
Alias

Language	Japanese
Label	計測装置
Description	先端RI(ARIM)装置分類
Alias

Semantic Relatives

Parents

Q1882: ARIM Instrument Dictionary

Siblings:

• Q1913: Calculation
• Q1914: Synthesis and Processing Instruments

Children

• Q1886: Magnetic Resonance

  • Q1929: Electron Spin Resonance
  • Q1933: Magnetic Resonance Imaging
• Q1889: Electron Microscope

  • Q1930: Electron Probe Micro Analyzer
  • Q1934: Transmission Electron Microscope
  • Q1935: Scanning Transmission Electron Microscope
  • Q1936: Scannning Electron Microscope
  • Q1937: Ultra-high Voltage Electron Microscope
  • Q1938: Cryo-Electron Microscope
  • Q1939: 3D Electron Microscope
  • Q1940: Correlative Microscopy
  • Q1941: Photoemission Electron Microscope
  • Q1942: Low-energy Electron Microscope
• Q1890: Sample Prepration

  • Q1931: Ultramicrotome
  • Q1943: Ion Milling
  • Q1944: Focused Ion Beam
• Q1891: Optical Microscope

  • Q1932: Phase-contrast Microscope
  • Q1945: Confocal Laser Scanning Microscope
  • Q1946: Fluorescence Microscope
  • Q1947: Stereoscopic Microscope
  • Q1948: Super Resolution Microscope
• Q1892: Scanning Probe Microscope

  • Q1949: Scanning Tunneling Microscope
  • Q1950: Atomic Force Microscope
• Q1893: Chromatograph

  • Q1951: Gas-phase Chromatograph
  • Q1952: Ion Chromatograph
  • Q1953: Lliquid-phase Chromatograph
  • Q1954: Gel Permeation Chromatograph
• Q1894: Spectroscopy

  • Q1955: Infrared Spectroscopy
  • Q1956: Ultraviolet Visible Spectroscopy
  • Q1957: Ultraviolet Visible Near-Infrared Spectroscopy
  • Q1958: Nnear‐Infrared Spectroscopy
  • Q1959: Flourescence Spectroscopy
  • Q1960: Inductively Coupled Plasma Atomic Emission Spectroscopy
  • Q1961: X-Ray Flourescence Spectroscopy
  • Q1962: Raman Spectroscopy
  • Q1963: Circular Dichroism
  • Q1964: X-Ray Absorption Spectroscopy
  • Q1965: X-Ray Emission Spectroscopy
  • Q1966: X-Ray Photoelectron Spectroscopy
  • Q1967: Auger Electron Spectroscopy
  • Q1968: Photoemission Electron Spectroscopy
• Q1896: Synchrotron Radiation

  • Q1969: Scanning X-Ray Microscope
  • Q1970: HardX-ray Photoelectron Spectroscopy
  • Q1971: Extended X-ray Absorption Fine Structure
  • Q1972: X-ray Absorption Near Edge Structure
  • Q1973: X-ray Diffraction-Synchrotron Radiation
• Q1897: Mass Spectrometer

  • Q1974: Double-Focusing Mass Spectrometer
  • Q1975: Quadrupole Mass Analyzer; Quadrupole Mass Spectrometer
  • Q1976: Time-Of-Flight Mass Spectrometer
  • Q1977: Ion Trap Mass Spectrometer
  • Q1978: Fourier Transfom Ion Cyclotron Resonance Mass Spectrometer
  • Q1979: Time-Of-Flight Secondary Ion Mass Spectrometry
  • Q1980: Inductively Coupled Plasma Mass Spectrometry
  • Q1981: Maldi-Tof Mass Spectrometer
  • Q1982: Secondary Ion Mass Spectrometer
  • Q1983: Direct Analysis In Real Time Mass Spectrometer
  • Q1984: Gas Chromatography - Mass Spectorometer
  • Q1985: Liquid Chromatography - Mass Spectorometer
• Q1898: Scattering & Diffraction

  • Q1986: Single Crystal X-Ray Diffraction
  • Q1987: Neutron Diffraction
  • Q1988: X-Ray Topography
  • Q1989: X-Ray Microtomography
  • Q1990: Rutherford Backscattering Spectrometry
  • Q1991: Electron Diffraction
  • Q2114: X-Ray Diffraction
• Q1899: Magnetic Characteristic

  • Q1992: Magnetic Property Measurement System
  • Q1993: Physical Property Measurement System
  • Q1994: Vibrating Sample Magnetometer
• Q1900: Biological

  • Q1995: Real-Time PCR
  • Q1996: PCR
  • Q1997: Surface Plasmon Resonance (SPR)
  • Q1998: Plate Reader
  • Q1999: Laser Scanner
  • Q2000: Flow Cytometry
  • Q2001: Cell Sorter
  • Q2002: Electrophoresis
  • Q2003: Gel Imaging Device
  • Q2004: Laser Microdissection (LMD)
  • Q2005: DNA Sequencer
• Q1901: Analysis

  • Q2006: Differential Scanning Calorimetry
  • Q2007: Thermal Gravimetric Analysis
  • Q2008: Thermal Gravimetric Differential Scanning Calorimetry
  • Q2009: Thermomechanical Analyzer
  • Q2010: Viscoelasticity
  • Q2011: Profiler
  • Q2012: Film Thickness Measurement
  • Q2013: Ellipsometry
  • Q2014: Contact Angle Meter
  • Q2015: Zeta Potential
  • Q2016: Dynamic Light Scattering
  • Q2017: Static Light Scattering
  • Q2018: Vapor Pressure Osmometer
  • Q2019: Electronic Property
  • Q2020: Electronic Materials & Device characterization
  • Q2021: Mössbauer Spectrometer
• Q1902: Electron Chemical

  • Q2022: Amoperometry
  • Q2023: Potentiometry
  • Q2024: Voltammetry
• Q1903: Mechanical Properties

  • Q2025: Compression Test
  • Q2026: Creep Test
  • Q2027: Dynamic Mechanical Analysis
  • Q2028: Fatigue Testing
  • Q2029: Hardness Testing
  • Q2030: Nanoindentation
  • Q2031: Shear or Torsion
  • Q2032: Tension Test
• Q2108: Nuclear Magnetic Resonance