Jump to text

Search Targets

Showing 1 result:

Q1942: Low-energy Electron Microscope

Vocabulary ID

http://matvoc.nims.go.jp/entity/Q1942

Language Label Description Alias
English Low-energy Electron Microscope ARIM instrument classification LEEM
Japanese 低エネルギー電子顕微鏡 先端RI(ARIM)装置分類 LEEM
Language English
Label Low-energy Electron Microscope
Description ARIM instrument classification
Alias LEEM
Language Japanese
Label 低エネルギー電子顕微鏡
Description 先端RI(ARIM)装置分類
Alias LEEM