Q1892: Scanning Probe Microscope
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q1892
Simliar
| Language | Label | Description | Alias |
|---|---|---|---|
| English | Scanning Probe Microscope | ARIM instrument classification | - |
| Japanese | 走査型プローブ顕微鏡 | 先端RI(ARIM)装置分類 | - |
| Language | English |
|---|---|
| Label | Scanning Probe Microscope |
| Description | ARIM instrument classification |
| Alias |
| Language | Japanese |
|---|---|
| Label | 走査型プローブ顕微鏡 |
| Description | 先端RI(ARIM)装置分類 |
| Alias |
Semantic Relatives
Parents
Q1884: Characterization Instrument
Siblings:- Q1886: Magnetic Resonance
- Q1889: Electron Microscope
- Q1890: Sample Prepration
- Q1891: Optical Microscope
- Q1893: Chromatograph
- Q1894: Spectroscopy
- Q1896: Synchrotron Radiation
- Q1897: Mass Spectrometer
- Q1898: Scattering & Diffraction
- Q1899: Magnetic Characteristic
- Q1900: Biological
- Q1901: Analysis
- Q1902: Electron Chemical
- Q1903: Mechanical Properties
- Q2108: Nuclear Magnetic Resonance