Q1979: Time-Of-Flight Secondary Ion Mass Spectrometry
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q1979
| Language | Label | Description | Alias |
|---|---|---|---|
| English | Time-Of-Flight Secondary Ion Mass Spectrometry | ARIM instrument classification | TOF-SIMS |
| Japanese | 飛行時間二次イオン質量分析 | 先端RI(ARIM)装置分類 | TOF-SIMS |
| Language | English |
|---|---|
| Label | Time-Of-Flight Secondary Ion Mass Spectrometry |
| Description | ARIM instrument classification |
| Alias | TOF-SIMS |
| Language | Japanese |
|---|---|
| Label | 飛行時間二次イオン質量分析 |
| Description | 先端RI(ARIM)装置分類 |
| Alias | TOF-SIMS |
Semantic Relatives
Parents
Q1897: Mass Spectrometer
Siblings:- Q1974: Double-Focusing Mass Spectrometer
- Q1975: Quadrupole Mass Analyzer; Quadrupole Mass Spectrometer
- Q1976: Time-Of-Flight Mass Spectrometer
- Q1977: Ion Trap Mass Spectrometer
- Q1978: Fourier Transfom Ion Cyclotron Resonance Mass Spectrometer
- Q1980: Inductively Coupled Plasma Mass Spectrometry
- Q1981: Maldi-Tof Mass Spectrometer
- Q1982: Secondary Ion Mass Spectrometer
- Q1983: Direct Analysis In Real Time Mass Spectrometer
- Q1984: Gas Chromatography - Mass Spectorometer
- Q1985: Liquid Chromatography - Mass Spectorometer