Q2020: Electronic Materials & Device characterization
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q2020
| Language | Label | Description | Alias |
|---|---|---|---|
| English | Electronic Materials & Device characterization | ARIM instrument classification | - |
| Japanese | 電子材料・デバイス評価 | 先端RI(ARIM)装置分類 | - |
| Language | English |
|---|---|
| Label | Electronic Materials & Device characterization |
| Description | ARIM instrument classification |
| Alias |
| Language | Japanese |
|---|---|
| Label | 電子材料・デバイス評価 |
| Description | 先端RI(ARIM)装置分類 |
| Alias |
Semantic Relatives
Parents
Q1901: Analysis
Siblings:- Q2006: Differential Scanning Calorimetry
- Q2007: Thermal Gravimetric Analysis
- Q2008: Thermal Gravimetric Differential Scanning Calorimetry
- Q2009: Thermomechanical Analyzer
- Q2010: Viscoelasticity
- Q2011: Profiler
- Q2012: Film Thickness Measurement
- Q2013: Ellipsometry
- Q2014: Contact Angle Meter
- Q2015: Zeta Potential
- Q2016: Dynamic Light Scattering
- Q2017: Static Light Scattering
- Q2018: Vapor Pressure Osmometer
- Q2019: Electronic Property
- Q2021: Mössbauer Spectrometer