Q1901: Analysis
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q1901
Simliar
| Language | Label | Description | Alias |
|---|---|---|---|
| English | Analysis | ARIM instrument classification | - |
| Japanese | その他分析装置 | 先端RI(ARIM)装置分類 | - |
| Language | English |
|---|---|
| Label | Analysis |
| Description | ARIM instrument classification |
| Alias |
| Language | Japanese |
|---|---|
| Label | その他分析装置 |
| Description | 先端RI(ARIM)装置分類 |
| Alias |
Semantic Relatives
Parents
Q1884: Characterization Instrument
Siblings:- Q1886: Magnetic Resonance
- Q1889: Electron Microscope
- Q1890: Sample Prepration
- Q1891: Optical Microscope
- Q1892: Scanning Probe Microscope
- Q1893: Chromatograph
- Q1894: Spectroscopy
- Q1896: Synchrotron Radiation
- Q1897: Mass Spectrometer
- Q1898: Scattering & Diffraction
- Q1899: Magnetic Characteristic
- Q1900: Biological
- Q1902: Electron Chemical
- Q1903: Mechanical Properties
- Q2108: Nuclear Magnetic Resonance
Children
- Q2006: Differential Scanning Calorimetry
- Q2007: Thermal Gravimetric Analysis
- Q2008: Thermal Gravimetric Differential Scanning Calorimetry
- Q2009: Thermomechanical Analyzer
- Q2010: Viscoelasticity
- Q2011: Profiler
- Q2012: Film Thickness Measurement
- Q2013: Ellipsometry
- Q2014: Contact Angle Meter
- Q2015: Zeta Potential
- Q2016: Dynamic Light Scattering
- Q2017: Static Light Scattering
- Q2018: Vapor Pressure Osmometer
- Q2019: Electronic Property
- Q2020: Electronic Materials & Device characterization
- Q2021: Mössbauer Spectrometer