Q1882: ARIM Instrument Dictionary
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q1882
| Language | Label | Description | Alias |
|---|---|---|---|
| English | ARIM Instrument Dictionary | - | - |
| Japanese | 先端RI(ARIM)装置辞書 | - | - |
| Language | English |
|---|---|
| Label | ARIM Instrument Dictionary |
| Description | |
| Alias |
| Language | Japanese |
|---|---|
| Label | 先端RI(ARIM)装置辞書 |
| Description | |
| Alias |
Semantic Relatives
Children
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Q1884: Characterization Instrument
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Q1889: Electron Microscope
- Q1930: Electron Probe Micro Analyzer
- Q1934: Transmission Electron Microscope
- Q1935: Scanning Transmission Electron Microscope
- Q1936: Scannning Electron Microscope
- Q1937: Ultra-high Voltage Electron Microscope
- Q1938: Cryo-Electron Microscope
- Q1939: 3D Electron Microscope
- Q1940: Correlative Microscopy
- Q1941: Photoemission Electron Microscope
- Q1942: Low-energy Electron Microscope
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Q1894: Spectroscopy
- Q1955: Infrared Spectroscopy
- Q1956: Ultraviolet Visible Spectroscopy
- Q1957: Ultraviolet Visible Near-Infrared Spectroscopy
- Q1958: Nnear‐Infrared Spectroscopy
- Q1959: Flourescence Spectroscopy
- Q1960: Inductively Coupled Plasma Atomic Emission Spectroscopy
- Q1961: X-Ray Flourescence Spectroscopy
- Q1962: Raman Spectroscopy
- Q1963: Circular Dichroism
- Q1964: X-Ray Absorption Spectroscopy
- Q1965: X-Ray Emission Spectroscopy
- Q1966: X-Ray Photoelectron Spectroscopy
- Q1967: Auger Electron Spectroscopy
- Q1968: Photoemission Electron Spectroscopy
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Q1897: Mass Spectrometer
- Q1974: Double-Focusing Mass Spectrometer
- Q1975: Quadrupole Mass Analyzer; Quadrupole Mass Spectrometer
- Q1976: Time-Of-Flight Mass Spectrometer
- Q1977: Ion Trap Mass Spectrometer
- Q1978: Fourier Transfom Ion Cyclotron Resonance Mass Spectrometer
- Q1979: Time-Of-Flight Secondary Ion Mass Spectrometry
- Q1980: Inductively Coupled Plasma Mass Spectrometry
- Q1981: Maldi-Tof Mass Spectrometer
- Q1982: Secondary Ion Mass Spectrometer
- Q1983: Direct Analysis In Real Time Mass Spectrometer
- Q1984: Gas Chromatography - Mass Spectorometer
- Q1985: Liquid Chromatography - Mass Spectorometer
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Q1901: Analysis
- Q2006: Differential Scanning Calorimetry
- Q2007: Thermal Gravimetric Analysis
- Q2008: Thermal Gravimetric Differential Scanning Calorimetry
- Q2009: Thermomechanical Analyzer
- Q2010: Viscoelasticity
- Q2011: Profiler
- Q2012: Film Thickness Measurement
- Q2013: Ellipsometry
- Q2014: Contact Angle Meter
- Q2015: Zeta Potential
- Q2016: Dynamic Light Scattering
- Q2017: Static Light Scattering
- Q2018: Vapor Pressure Osmometer
- Q2019: Electronic Property
- Q2020: Electronic Materials & Device characterization
- Q2021: Mössbauer Spectrometer
- Q2108: Nuclear Magnetic Resonance