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Q1938: Cryo-Electron Microscope

Language Label Description Alias
English Cryo-Electron Microscope ARIM instrument classification -
Japanese クライオ電子顕微鏡 先端RI(ARIM)装置分類 -
Language English
Label Cryo-Electron Microscope
Description ARIM instrument classification
Alias
Language Japanese
Label クライオ電子顕微鏡
Description 先端RI(ARIM)装置分類
Alias