Language	Label	Description	Alias
English	Scanning Transmission Electron Microscope	ARIM instrument classification	STEM
Japanese	走査型透過電子顕微鏡	先端RI(ARIM)装置分類	STEM

Language	English
Label	Scanning Transmission Electron Microscope
Description	ARIM instrument classification
Alias	STEM

Language	Japanese
Label	走査型透過電子顕微鏡
Description	先端RI(ARIM)装置分類
Alias	STEM

Semantic Relatives

Parents

Q1889: Electron Microscope

Siblings:

• Q1930: Electron Probe Micro Analyzer
• Q1934: Transmission Electron Microscope
• Q1936: Scannning Electron Microscope
• Q1937: Ultra-high Voltage Electron Microscope
• Q1938: Cryo-Electron Microscope
• Q1939: 3D Electron Microscope
• Q1940: Correlative Microscopy
• Q1941: Photoemission Electron Microscope
• Q1942: Low-energy Electron Microscope