Language	Label	Description	Alias
English	Photoemission Electron Microscope	ARIM instrument classification	-
Japanese	光電子顕微鏡	先端RI(ARIM)装置分類	-

Language	English
Label	Photoemission Electron Microscope
Description	ARIM instrument classification
Alias

Language	Japanese
Label	光電子顕微鏡
Description	先端RI(ARIM)装置分類
Alias

Semantic Relatives

Parent

Q1889: Electron Microscope

Siblings:

• Q1930: Electron Probe Micro Analyzer
• Q1934: Transmission Electron Microscope
• Q1935: Scanning Transmission Electron Microscope
• Q1936: Scannning Electron Microscope
• Q1937: Ultra-high Voltage Electron Microscope
• Q1938: Cryo-Electron Microscope
• Q1939: 3D Electron Microscope
• Q1940: Correlative Microscopy
• Q1942: Low-energy Electron Microscope