Q1936: Scannning Electron Microscope
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q1936
| Language | Label | Description | Alias |
|---|---|---|---|
| English | Scannning Electron Microscope | ARIM instrument classification | SEM |
| Japanese | 走査型電子顕微鏡 | 先端RI(ARIM)装置分類 | SEM |
| Language | English |
|---|---|
| Label | Scannning Electron Microscope |
| Description | ARIM instrument classification |
| Alias | SEM |
| Language | Japanese |
|---|---|
| Label | 走査型電子顕微鏡 |
| Description | 先端RI(ARIM)装置分類 |
| Alias | SEM |
Semantic Relatives
Parents
Q1889: Electron Microscope
Siblings:- Q1930: Electron Probe Micro Analyzer
- Q1934: Transmission Electron Microscope
- Q1935: Scanning Transmission Electron Microscope
- Q1937: Ultra-high Voltage Electron Microscope
- Q1938: Cryo-Electron Microscope
- Q1939: 3D Electron Microscope
- Q1940: Correlative Microscopy
- Q1941: Photoemission Electron Microscope
- Q1942: Low-energy Electron Microscope