Language	Label	Description	Alias
English	Transmission Electron Microscope	ARIM instrument classification	TEM
Japanese	透過型電子顕微鏡	先端RI(ARIM)装置分類	TEM

Language	English
Label	Transmission Electron Microscope
Description	ARIM instrument classification
Alias	TEM

Language	Japanese
Label	透過型電子顕微鏡
Description	先端RI(ARIM)装置分類
Alias	TEM

Semantic Relatives

Parents

Q1889: Electron Microscope

Siblings:

• Q1930: Electron Probe Micro Analyzer
• Q1935: Scanning Transmission Electron Microscope
• Q1936: Scannning Electron Microscope
• Q1937: Ultra-high Voltage Electron Microscope
• Q1938: Cryo-Electron Microscope
• Q1939: 3D Electron Microscope
• Q1940: Correlative Microscopy
• Q1941: Photoemission Electron Microscope
• Q1942: Low-energy Electron Microscope