Language	Label	Description	Alias
English	3D Electron Microscope	ARIM instrument classification	-
Japanese	三次元電子顕微鏡	先端RI(ARIM)装置分類	-

Language	English
Label	3D Electron Microscope
Description	ARIM instrument classification
Alias

Language	Japanese
Label	三次元電子顕微鏡
Description	先端RI(ARIM)装置分類
Alias

Semantic Relatives

Parent

Q1889: Electron Microscope

Siblings:

• Q1930: Electron Probe Micro Analyzer
• Q1934: Transmission Electron Microscope
• Q1935: Scanning Transmission Electron Microscope
• Q1936: Scannning Electron Microscope
• Q1937: Ultra-high Voltage Electron Microscope
• Q1938: Cryo-Electron Microscope
• Q1940: Correlative Microscopy
• Q1941: Photoemission Electron Microscope
• Q1942: Low-energy Electron Microscope