Jump to text

Search Targets

Showing 1 result:

Q1939: 3D Electron Microscope

Vocabulary ID

http://matvoc.nims.go.jp/entity/Q1939

Language Label Description Alias
English 3D Electron Microscope ARIM instrument classification -
Japanese 三次元電子顕微鏡 先端RI(ARIM)装置分類 -
Language English
Label 3D Electron Microscope
Description ARIM instrument classification
Alias
Language Japanese
Label 三次元電子顕微鏡
Description 先端RI(ARIM)装置分類
Alias