Language	Label	Description	Alias
English	X-Ray Topography	ARIM instrument classification	-
Japanese	X線トポグラフィー	先端RI(ARIM)装置分類	-

Language	English
Label	X-Ray Topography
Description	ARIM instrument classification
Alias

Language	Japanese
Label	X線トポグラフィー
Description	先端RI(ARIM)装置分類
Alias

Semantic Relatives

Parent

Q1898: Scattering & Diffraction

Siblings:

• Q1986: Single Crystal X-Ray Diffraction
• Q1987: Neutron Diffraction
• Q1989: X-Ray Microtomography
• Q1990: Rutherford Backscattering Spectrometry
• Q1991: Electron Diffraction
• Q2114: X-Ray Diffraction