Q2127: Low-energy Electron Microscope
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q2127
| Language | Label | Description | Alias |
|---|---|---|---|
| English | Low-energy Electron Microscope | DICE instrument classification | LEEM |
| Japanese | 低エネルギー電子顕微鏡 | DICE装置分類 | LEEM |
| Language | English |
|---|---|
| Label | Low-energy Electron Microscope |
| Description | DICE instrument classification |
| Alias | LEEM |
| Language | Japanese |
|---|---|
| Label | 低エネルギー電子顕微鏡 |
| Description | DICE装置分類 |
| Alias | LEEM |
Semantic Relatives
Parents
Q1923: Electron Microscope
Siblings:- Q2119: Transmission Electron Microscope
- Q2120: Scanning Transmission Electron Microscope
- Q2121: Scannning Electron Microscope
- Q2122: Ultra-high Voltage Electron Microscope
- Q2123: Cryo-Electron Microscope
- Q2124: 3D Electron Microscope
- Q2125: Correlative Microscopy
- Q2126: Photoemission Electron Microscope
- Q2128: Electron Probe Micro Analyzer