Q37: microscopy
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q37
| Language | Label | Description | Alias |
|---|---|---|---|
| English | microscopy | - | - |
| Japanese | 顕微法 | - | - |
| Language | English |
|---|---|
| Label | microscopy |
| Description | |
| Alias |
| Language | Japanese |
|---|---|
| Label | 顕微法 |
| Description | |
| Alias |
Semantic Relatives
Parents
Q22: characterization methods
Siblings:- Q30: spectroscopy
- Q48: scattering and diffraction
- Q315: charge distribution
- Q317: chromatography
- Q322: dilatometry
- Q323: electrochemical
- Q353: osmometry
- Q357: profilometry
- Q369: spectrometry
- Q389: thermochemical
- Q395: tomography
- Q398: ultrasonic
- Q399: viscometry
- Q566: optical measurement
- Q3078: mechanical properties measurement
- Q3079: magnetic resonance
- Q3080: sample processing
- Q3081: magnetic properties analysis
- Q3082: bio analysis
- Q3083: physical chemistry analysis
- Q3084: electrical properties measurement
- Q3085: semiconductor device properties measurement
Children
- Q38: scanning Auger electron microscopy
- Q45: scanning transmission electron microscopy
- Q51: transmission electron microscopy
- Q334: analytical electron microscopy
- Q335: atomic force microscopy
- Q336: confocal microscopy
- Q337: electron probe microanalysis
- Q338: environmental scanning electron microscopy
- Q339: field emission electron probe
- Q340: optical microscopy
- Q341: photoluminescence microscopy
- Q342: scanning electron microscopy
- Q343: scanning Kelvin probe
- Q344: scanning probe microscopy
- Q345: scanning tunneling microscopy
- Q346: x-ray optical interferometry