Q3085: semiconductor device properties measurement
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q3085
| Language | Label | Description | Alias |
|---|---|---|---|
| English | semiconductor device properties measurement | methods and technology of semicondutor device property analysis | - |
| Japanese | 半導体デバイス特性測定 | 半導体デバイス特性の測定技術および手法 | - |
| Language | English |
|---|---|
| Label | semiconductor device properties measurement |
| Description | methods and technology of semicondutor device property analysis |
| Alias |
| Language | Japanese |
|---|---|
| Label | 半導体デバイス特性測定 |
| Description | 半導体デバイス特性の測定技術および手法 |
| Alias |
Semantic Relatives
Parents
Q22: characterization methods
Siblings:- Q30: spectroscopy
- Q37: microscopy
- Q48: scattering and diffraction
- Q315: charge distribution
- Q317: chromatography
- Q322: dilatometry
- Q323: electrochemical
- Q353: osmometry
- Q357: profilometry
- Q369: spectrometry
- Q389: thermochemical
- Q395: tomography
- Q398: ultrasonic
- Q399: viscometry
- Q566: optical measurement
- Q3078: mechanical properties measurement
- Q3079: magnetic resonance
- Q3080: sample processing
- Q3081: magnetic properties analysis
- Q3082: bio analysis
- Q3083: physical chemistry analysis
- Q3084: electrical properties measurement