Language	Label	Description	Alias
English	transmission electron microscopy	transmission electron microscopy (2026-02-24 10:19:32)	-
Japanese	透過電子顕微法	透過電子顕微法 (2026-02-24 10:19:32)	-

Language	English
Label	transmission electron microscopy
Description	transmission electron microscopy (2026-02-24 10:19:32)
Alias

Language	Japanese
Label	透過電子顕微法
Description	透過電子顕微法 (2026-02-24 10:19:32)
Alias

Semantic Relatives

Parent

Q37: microscopy

Siblings:

• Q38: scanning Auger electron microscopy
• Q45: scanning transmission electron microscopy
• Q334: analytical electron microscopy
• Q335: atomic force microscopy
• Q336: confocal microscopy
• Q337: electron probe microanalysis
• Q338: environmental scanning electron microscopy
• Q339: field emission electron probe
• Q340: optical microscopy
• Q341: photoluminescence microscopy
• Q342: scanning electron microscopy
• Q343: scanning Kelvin probe
• Q344: scanning probe microscopy
• Q345: scanning tunneling microscopy
• Q346: x-ray optical interferometry
• Q550: Not available
• Q551: Other