Q30: spectroscopy
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q30
| Language | Label | Description | Alias |
|---|---|---|---|
| English | spectroscopy | - | - |
| Japanese | 分光法 | - | スペクトル解析, スペクトロスコピー |
| Language | English |
|---|---|
| Label | spectroscopy |
| Description | |
| Alias |
| Language | Japanese |
|---|---|
| Label | 分光法 |
| Description | |
| Alias | スペクトル解析, スペクトロスコピー |
Semantic Relatives
Parents
Q22: characterization methods
Siblings:- Q37: microscopy
- Q48: scattering and diffraction
- Q315: charge distribution
- Q317: chromatography
- Q322: dilatometry
- Q323: electrochemistry
- Q353: osmometry
- Q357: profilometry
- Q369: spectrometry
- Q389: thermochemical
- Q395: tomography
- Q398: ultrasonic
- Q399: viscometry
- Q566: optical measurement
- Q3078: mechanical properties measurement
- Q3079: magnetic resonance
- Q3080: sample processing
- Q3081: magnetic properties analysis
- Q3082: bio analysis
- Q3083: physical chemistry analysis
- Q3084: electrical properties measurement
- Q3085: semiconductor device properties measurement
Children
- Q31: x-ray photoelectron spectroscopy
- Q38: scanning Auger electron microscopy
- Q52: electron energy-loss spectroscopy
- Q378: dielectric and impedance spectroscopy
- Q379: dynamic mechanical spectroscopy
- Q381: EXAFS
- Q382: Fourier-transform infrared spectroscopy
- Q383: NEXAFS
- Q384: NMR
- Q385: Raman
- Q386: x-ray absorption spectroscopy
- Q387: x-ray emission spectroscopy
- Q388: XPS variable kinetic
- Q632: Auger electron spectroscopy
- Q681: Photoemission Yield Spectroscopy in Air
- Q2829: hard x-ray photoelectron spectroscopy
Q483666