Language	Label	Description	Alias
English	scanning Auger electron microscopy	-	scanning Auger microscopy
Japanese	走査型オージェ電子顕微鏡法	-	-

Language	English
Label	scanning Auger electron microscopy
Description
Alias	scanning Auger microscopy

Language	Japanese
Label	走査型オージェ電子顕微鏡法
Description
Alias

Semantic Relatives

Parents

Q30: spectroscopy

Siblings:

• Q31: x-ray photoelectron spectroscopy
• Q52: electron energy-loss spectroscopy
• Q378: dielectric and impedance spectroscopy
• Q379: dynamic mechanical spectroscopy
• Q381: EXAFS
• Q382: Fourier-transform infrared spectroscopy
• Q383: NEXAFS
• Q384: NMR
• Q385: Raman
• Q386: x-ray absorption spectroscopy
• Q387: x-ray emission spectroscopy
• Q388: XPS variable kinetic
• Q550: Not available
• Q551: Other
• Q632: Auger electron spectroscopy
• Q681: Photoemission Yield Spectroscopy in Air
• Q2829: hard x-ray photoelectron spectroscopy

Q37: microscopy

Siblings:

• Q45: scanning transmission electron microscopy
• Q51: transmission electron microscopy
• Q334: analytical electron microscopy
• Q335: atomic force microscopy
• Q336: confocal microscopy
• Q337: electron probe microanalysis
• Q338: environmental scanning electron microscopy
• Q339: field emission electron probe
• Q340: optical microscopy
• Q341: photoluminescence microscopy
• Q342: scanning electron microscopy
• Q343: scanning Kelvin probe
• Q344: scanning probe microscopy
• Q345: scanning tunneling microscopy
• Q346: x-ray optical interferometry
• Q550: Not available
• Q551: Other