Q38: scanning Auger electron microscopy
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q38
| Language | Label | Description | Alias |
|---|---|---|---|
| English | scanning Auger electron microscopy | - | scanning Auger microscopy |
| Japanese | 走査型オージェ電子顕微鏡法 | - | - |
| Language | English |
|---|---|
| Label | scanning Auger electron microscopy |
| Description | |
| Alias | scanning Auger microscopy |
| Language | Japanese |
|---|---|
| Label | 走査型オージェ電子顕微鏡法 |
| Description | |
| Alias |
Semantic Relatives
Parents
Q30: spectroscopy
Siblings:- Q31: x-ray photoelectron spectroscopy
- Q52: electron energy-loss spectroscopy
- Q378: dielectric and impedance spectroscopy
- Q379: dynamic mechanical spectroscopy
- Q381: EXAFS
- Q382: Fourier-transform infrared spectroscopy
- Q383: NEXAFS
- Q384: NMR
- Q385: Raman
- Q386: x-ray absorption spectroscopy
- Q387: x-ray emission spectroscopy
- Q388: XPS variable kinetic
- Q632: Auger electron spectroscopy
- Q681: Photoemission Yield Spectroscopy in Air
- Q2829: hard x-ray photoelectron spectroscopy
Q37: microscopy
Siblings:- Q45: scanning transmission electron microscopy
- Q51: transmission electron microscopy
- Q334: analytical electron microscopy
- Q335: atomic force microscopy
- Q336: confocal microscopy
- Q337: electron probe microanalysis
- Q338: environmental scanning electron microscopy
- Q339: field emission electron probe
- Q340: optical microscopy
- Q341: photoluminescence microscopy
- Q342: scanning electron microscopy
- Q343: scanning Kelvin probe
- Q344: scanning probe microscopy
- Q345: scanning tunneling microscopy
- Q346: x-ray optical interferometry