Q344: scanning probe microscopy
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q344
| Language | Label | Description | Alias |
|---|---|---|---|
| English | scanning probe microscopy | - | - |
| Japanese | 走査型プローブ顕微鏡法 | - | - |
| Language | English |
|---|---|
| Label | scanning probe microscopy |
| Description | |
| Alias |
| Language | Japanese |
|---|---|
| Label | 走査型プローブ顕微鏡法 |
| Description | |
| Alias |
Semantic Relatives
Parents
Q37: microscopy
Siblings:- Q38: scanning Auger electron microscopy
- Q45: scanning transmission electron microscopy
- Q51: transmission electron microscopy
- Q334: analytical electron microscopy
- Q335: atomic force microscopy
- Q336: confocal microscopy
- Q337: electron probe microanalysis
- Q338: environmental scanning electron microscopy
- Q339: field emission electron probe
- Q340: optical microscopy
- Q341: photoluminescence microscopy
- Q342: scanning electron microscopy
- Q343: scanning Kelvin probe
- Q345: scanning tunneling microscopy
- Q346: x-ray optical interferometry