Language	Label	Description	Alias
English	characterization methods	-	-
Japanese	計測手法	-	測定手法

Language	English
Label	characterization methods
Description
Alias

Language	Japanese
Label	計測手法
Description
Alias	測定手法

Semantic Relatives

Parents

Q21: DICE Materials Data Vocabulary

Siblings:

• Q24: computational methods
• Q25: data origin
• Q26: material types
• Q27: properties addressed
• Q28: structural features
• Q29: synthesis and processing

Children

• Q30: spectroscopy

  • Q31: x-ray photoelectron spectroscopy
  • Q38: scanning Auger electron microscopy
  • Q52: electron energy-loss spectroscopy
  • Q378: dielectric and impedance spectroscopy
  • Q379: dynamic mechanical spectroscopy
  • Q381: EXAFS
  • Q382: Fourier-transform infrared spectroscopy
  • Q383: NEXAFS
  • Q384: NMR
  • Q385: Raman
  • Q386: x-ray absorption spectroscopy
  • Q387: x-ray emission spectroscopy
  • Q388: XPS variable kinetic
  • Q632: Auger electron spectroscopy
  • Q681: Photoemission Yield Spectroscopy in Air
  • Q2829: hard x-ray photoelectron spectroscopy
• Q37: microscopy

  • Q38: scanning Auger electron microscopy
  • Q45: scanning transmission electron microscopy
  • Q51: transmission electron microscopy
  • Q334: analytical electron microscopy
  • Q335: atomic force microscopy
  • Q336: confocal microscopy
  • Q337: electron probe microanalysis
  • Q338: environmental scanning electron microscopy
  • Q339: field emission electron probe
  • Q340: optical microscopy
  • Q341: photoluminescence microscopy
  • Q342: scanning electron microscopy
  • Q343: scanning Kelvin probe
  • Q344: scanning probe microscopy
  • Q345: scanning tunneling microscopy
  • Q346: x-ray optical interferometry
• Q48: scattering and diffraction

  • Q49: x-ray diffraction
• Q315: charge distribution

  • Q316: pulsed electroacoustic method
• Q317: chromatography

  • Q318: critical and supercritical chromatography
  • Q319: gas-phase chromatography
  • Q320: ion chromatography
  • Q321: liquid-phase chromatography
• Q322: dilatometry
• Q323: electrochemical

  • Q324: amperometry
  • Q325: potentiometry
  • Q326: voltammetry
• Q353: osmometry

  • Q354: freezing point depression osmometry
  • Q355: membrane osmometry
  • Q356: vapor pressure depression osmometry
• Q357: profilometry
• Q369: spectrometry

  • Q370: alpha spectrometry
  • Q371: energy dispersive x-ray spectometry
  • Q372: gamma spectrometry
  • Q373: ion mobility spectrometry
  • Q374: IR_FTIR spectrometry
  • Q375: mass spectrometry
  • Q376: secondary ion mass spectrometry
  • Q377: x-ray flourescence spectrometry
  • Q680: Glow discharge mass spectrometry
• Q389: thermochemical

  • Q390: calorimetry
  • Q391: differential scanning calorimetry
  • Q392: differential thermal analysis
  • Q393: microcalorimetry
  • Q394: thermogravimetry
• Q395: tomography

  • Q396: atom probe tomography
  • Q397: x-ray tomography
• Q398: ultrasonic
• Q399: viscometry
• Q566: optical measurement
• Q3078: mechanical properties measurement

  • Q327: compression tests
  • Q328: creep tests
  • Q329: dynamic mechanical analysis
  • Q546: other mechanical characterization
• Q3079: magnetic resonance
• Q3080: sample processing
• Q3081: magnetic properties analysis
• Q3082: bio analysis
• Q3083: physical chemistry analysis
• Q3084: electrical properties measurement
• Q3085: semiconductor device properties measurement