Language	Label	Description	Alias
English	analytical electron microscopy	-	-
Japanese	分析電子顕微鏡法	-	-

Language	English
Label	analytical electron microscopy
Description
Alias

Language	Japanese
Label	分析電子顕微鏡法
Description
Alias

Semantic Relatives

Parents

Q37: microscopy

Siblings:

• Q38: scanning Auger electron microscopy
• Q45: scanning transmission electron microscopy
• Q51: transmission electron microscopy
• Q335: atomic force microscopy
• Q336: confocal microscopy
• Q337: electron probe microanalysis
• Q338: environmental scanning electron microscopy
• Q339: field emission electron probe
• Q340: optical microscopy
• Q341: photoluminescence microscopy
• Q342: scanning electron microscopy
• Q343: scanning Kelvin probe
• Q344: scanning probe microscopy
• Q345: scanning tunneling microscopy
• Q346: x-ray optical interferometry