Language	Label	Description	Alias
English	scanning transmission electron microscopy	-	STEM
Japanese	走査透過電子顕微鏡	走査透過電子顕微鏡 (2026-02-24 10:19:29)	-

Language	English
Label	scanning transmission electron microscopy
Description
Alias	STEM

Language	Japanese
Label	走査透過電子顕微鏡
Description	走査透過電子顕微鏡 (2026-02-24 10:19:29)
Alias

Semantic Relatives

Parent

Q37: microscopy

Siblings:

• Q38: scanning Auger electron microscopy
• Q51: transmission electron microscopy
• Q334: analytical electron microscopy
• Q335: atomic force microscopy
• Q336: confocal microscopy
• Q337: electron probe microanalysis
• Q338: environmental scanning electron microscopy
• Q339: field emission electron probe
• Q340: optical microscopy
• Q341: photoluminescence microscopy
• Q342: scanning electron microscopy
• Q343: scanning Kelvin probe
• Q344: scanning probe microscopy
• Q345: scanning tunneling microscopy
• Q346: x-ray optical interferometry
• Q550: Not available
• Q551: Other