Q378: dielectric and impedance spectroscopy
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q378
| Language | Label | Description | Alias |
|---|---|---|---|
| English | dielectric and impedance spectroscopy | - | - |
| Japanese | 誘電体・インピーダンス分光法 | - | 誘電体_インピーダンス分光法 |
| Language | English |
|---|---|
| Label | dielectric and impedance spectroscopy |
| Description | |
| Alias |
| Language | Japanese |
|---|---|
| Label | 誘電体・インピーダンス分光法 |
| Description | |
| Alias | 誘電体_インピーダンス分光法 |
Semantic Relatives
Parents
Q30: spectroscopy
Siblings:- Q31: x-ray photoelectron spectroscopy
- Q38: scanning Auger electron microscopy
- Q52: electron energy-loss spectroscopy
- Q379: dynamic mechanical spectroscopy
- Q381: EXAFS
- Q382: Fourier-transform infrared spectroscopy
- Q383: NEXAFS
- Q384: NMR
- Q385: Raman
- Q386: x-ray absorption spectroscopy
- Q387: x-ray emission spectroscopy
- Q388: XPS variable kinetic
- Q632: Auger electron spectroscopy
- Q681: Photoemission Yield Spectroscopy in Air
- Q2829: hard x-ray photoelectron spectroscopy