Language	Label	Description	Alias
English	Analysis	DICE instrument classification	-
Japanese	その他分析装置	DICE装置分類	-

Language	English
Label	Analysis
Description	DICE instrument classification
Alias

Language	Japanese
Label	その他分析装置
Description	DICE装置分類
Alias

Semantic Relatives

Parents

Q1885: Characterization Instrument

Siblings:

• Q1888: Magnetic Resonance
• Q1923: Electron Microscope
• Q1924: Sample Prepration
• Q1925: Optical Microscope
• Q1926: Scanning Probe Microscope
• Q1927: Chromatograph
• Q1928: Spectroscopy
• Q2072: Synchrotron Radiation
• Q2073: Mass Spectrometer
• Q2074: Scattering & Diffraction
• Q2075: Magnetic Characteristic
• Q2076: Biological
• Q2078: Electron Chemical
• Q2079: Mechanical Properties

Children

• Q2194: Differential Scanning Calorimetry
• Q2195: Thermal Gravimetric Analysis
• Q2196: Thermal Gravimetric Differential Scanning Calorimetry
• Q2197: Thermomechanical Analyzer
• Q2198: Viscoelasticity
• Q2199: Profiler
• Q2200: Film Thickness Measurement
• Q2201: Ellipsometry
• Q2202: Contact Angle Meter
• Q2203: Zeta Potential
• Q2204: Dynamic Light Scattering
• Q2205: Static Light Scattering
• Q2206: Vapor Pressure Osmometer
• Q2207: Electronic Property
• Q2208: Electronic Materials & Device characterization
• Q2209: Mössbauer Spectrometer