Q1926: Scanning Probe Microscope
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q1926
Simliar
| Language | Label | Description | Alias |
|---|---|---|---|
| English | Scanning Probe Microscope | DICE instrument classification | - |
| Japanese | 走査型プローブ顕微鏡 | DICE装置分類 | - |
| Language | English |
|---|---|
| Label | Scanning Probe Microscope |
| Description | DICE instrument classification |
| Alias |
| Language | Japanese |
|---|---|
| Label | 走査型プローブ顕微鏡 |
| Description | DICE装置分類 |
| Alias |
Semantic Relatives
Parents
Q1885: Characterization Instrument
Siblings:- Q1888: Magnetic Resonance
- Q1923: Electron Microscope
- Q1924: Sample Prepration
- Q1925: Optical Microscope
- Q1927: Chromatograph
- Q1928: Spectroscopy
- Q2072: Synchrotron Radiation
- Q2073: Mass Spectrometer
- Q2074: Scattering & Diffraction
- Q2075: Magnetic Characteristic
- Q2076: Biological
- Q2077: Analysis
- Q2078: Electron Chemical
- Q2079: Mechanical Properties