Language	Label	Description	Alias
English	Electron Microscope	DICE instrument classification	-
Japanese	電子顕微鏡	DICE装置分類	-

Language	English
Label	Electron Microscope
Description	DICE instrument classification
Alias

Language	Japanese
Label	電子顕微鏡
Description	DICE装置分類
Alias

Semantic Relatives

Parents

Q1885: Characterization Instrument

Siblings:

• Q1888: Magnetic Resonance
• Q1924: Sample Prepration
• Q1925: Optical Microscope
• Q1926: Scanning Probe Microscope
• Q1927: Chromatograph
• Q1928: Spectroscopy
• Q2072: Synchrotron Radiation
• Q2073: Mass Spectrometer
• Q2074: Scattering & Diffraction
• Q2075: Magnetic Characteristic
• Q2076: Biological
• Q2077: Analysis
• Q2078: Electron Chemical
• Q2079: Mechanical Properties

Children

• Q2119: Transmission Electron Microscope
• Q2120: Scanning Transmission Electron Microscope
• Q2121: Scannning Electron Microscope
• Q2122: Ultra-high Voltage Electron Microscope
• Q2123: Cryo-Electron Microscope
• Q2124: 3D Electron Microscope
• Q2125: Correlative Microscopy
• Q2126: Photoemission Electron Microscope
• Q2127: Low-energy Electron Microscope
• Q2128: Electron Probe Micro Analyzer