Language	Label	Description	Alias
English	Scattering & Diffraction	DICE instrument classification	-
Japanese	回折・散乱	DICE装置分類	-

Language	English
Label	Scattering & Diffraction
Description	DICE instrument classification
Alias

Language	Japanese
Label	回折・散乱
Description	DICE装置分類
Alias

Semantic Relatives

Parent

Q1885: Characterization Instrument

Siblings:

• Q1888: Magnetic Resonance
• Q1923: Electron Microscope
• Q1924: Sample Prepration
• Q1925: Optical Microscope
• Q1926: Scanning Probe Microscope
• Q1927: Chromatograph
• Q1928: Spectroscopy
• Q2073: Mass Spectrometer
• Q2075: Magnetic Characteristic
• Q2078: Electron Chemical
• Q2072: Synchrotron Radiation
• Q2076: Biological
• Q2077: Analysis
• Q2079: Mechanical Properties

Children

• Q2174: Single Crystal X-Ray Diffraction
• Q2175: Neutron Diffraction
• Q2176: X-Ray Topography
• Q2177: X-Ray Microtomography
• Q2178: Rutherford Backscattering Spectrometry
• Q2179: Electron Diffraction
• Q2263: X-Ray Diffraction