Q2200: Film Thickness Measurement
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q2200
| Language | Label | Description | Alias |
|---|---|---|---|
| English | Film Thickness Measurement | DICE instrument classification | - |
| Japanese | 膜厚測定 | DICE装置分類 | - |
| Language | English |
|---|---|
| Label | Film Thickness Measurement |
| Description | DICE instrument classification |
| Alias |
| Language | Japanese |
|---|---|
| Label | 膜厚測定 |
| Description | DICE装置分類 |
| Alias |
Semantic Relatives
Parents
Q2077: Analysis
Siblings:- Q2194: Differential Scanning Calorimetry
- Q2195: Thermal Gravimetric Analysis
- Q2196: Thermal Gravimetric Differential Scanning Calorimetry
- Q2197: Thermomechanical Analyzer
- Q2198: Viscoelasticity
- Q2199: Profiler
- Q2201: Ellipsometry
- Q2202: Contact Angle Meter
- Q2203: Zeta Potential
- Q2204: Dynamic Light Scattering
- Q2205: Static Light Scattering
- Q2206: Vapor Pressure Osmometer
- Q2207: Electronic Property
- Q2208: Electronic Materials & Device characterization
- Q2209: Mössbauer Spectrometer