Jump to text

Search Targets

Showing 1 result:

Q2138: Atomic Force Microscope

Vocabulary ID

http://matvoc.nims.go.jp/entity/Q2138

Language Label Description Alias
English Atomic Force Microscope DICE instrument classification AFM
Japanese 原子間力顕微鏡 DICE装置分類 AFM
Language English
Label Atomic Force Microscope
Description DICE instrument classification
Alias AFM
Language Japanese
Label 原子間力顕微鏡
Description DICE装置分類
Alias AFM