Q560: analytical electron microscope
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q560
| Language | Label | Description | Alias |
|---|---|---|---|
| English | analytical electron microscope | - | - |
| Japanese | 分析電子顕微鏡 | - | - |
| Language | English |
|---|---|
| Label | analytical electron microscope |
| Description | |
| Alias |
| Language | Japanese |
|---|---|
| Label | 分析電子顕微鏡 |
| Description | |
| Alias |
Semantic Relatives
Parents
Q0: Others (Items with no parent or child)
Siblings:- Q2: Resource
- Q3: National Institute for Materials Science
- Q4: Materials Data Platform
- Q5: DPF dictionary
- Q6: administrative dictionary
- Q7: materials dictionary
- Q8: properties dictionary
- Q9: characterization dictionary
- Q10: calculations dictionary
- Q11: structures dictionary
- Q12: instruments dictionary
- Q13: computers dictionary
- Q14: structural components dictionary
- Q15: processes dictionary
- Q16: miscellaneous dictionary
- Q17: units dictionary
- Q18: pressure
- Q19: pascal
- Q20: National Institute of Standards and Technology
- Q36: crystalographic structure
- Q41: license
- Q43: dummy dictionary
- Q50: chemical state
- Q53: qualitative analysis
- Q59: morphological analysis
- Q189: open-framework
- Q509: DPFC expansion of the Materials Data Vocabulary
- Q510: quantitative analysis
- Q511: surface analysis
- Q512: elemental analysis
- Q513: in vacuum
- Q514: Peak Center
- Q515: second
- Q516: unit of measurement
- Q518: quantity
- Q519: time
- Q520: unit of time
- Q521: data type
- Q522: string
- Q523: Data Collection System
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- Q526: stress tensor
- Q527: stress
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- Q537: Creative Commons CC0 1.0 Universal
- Q538: Creative Commons Public Domain Mark 1.0
- Q539: Apache License 2.0
- Q540: GNU General Public License
- Q541: MIT License
- Q542: in atmosphere
- Q543: in liquid
- Q544: in inert gas
- Q545: crystal structure
- Q549: environment
- Q552: in vacuum
- Q553: in high pressure
- Q554: in magnetic field
- Q555: at low temperature
- Q556: polycrystal
- Q557: FCC particles on amorphous film
- Q558: characterization instruments
- Q559: microscope
- Q561: synthesis and processing instruments
- Q562: deposition and coating instruments
- Q563: spin coater
- Q643: biological property
- Q644: distribution
- Q645: electronic property
- Q646: environmental analysis
- Q647: failure analysis
- Q648: impurity analysis
- Q649: magnetic property
- Q650: optical property
- Q651: physical property
- Q652: theoretical simulation
- Q658: 散乱理論
- Q678: analysis field
- Q679: NIMS MDPF Common Messaging Format
- Q684: unit of measure
- Q688: crystallographic analysis
- Q694: copper(II) chloride
- Q716: XAFS DB Project in NIMS
- Q1863: RIKEN KEIKI Dataset Dictionary
- Q1881: NGC system registration law
- Q2839: Glow Discharge Mass Spectrometry
- Q3054: (test)スペクトル最適化
- Q3056: half width at half maximum
- Q3057: height
- Q3058: position
- Q3059: Lorentz-Gauss mixing ratio
- Q3060: area
- Q3519: Thermophysical Property Database Project in NIMS
- Q3623: Yb2O3
- Q3624: Ni-10at%Ti
- Q3625: Ni-60at%Ti
- Q3626: Y2O3
- Q3634: Starrydata vocabulary
- Q3694: Calcium sulfate Hydrous
- Q3695: Scotch tape
- Q3696: Sulfate green rust
- Q3697: Arsenic sulfide
- Q3698: Arsenic (III) oxide
- Q3699: Sodium selenite
- Q3700: Slawsonite
- Q3701: Monteponite
- Q3702: Europium(II) titanate
- Q3703: Europium(II) selenide
- Q3955: Nickel(II) hydroxide
- Q3970: Trivanesium tetrasulfide
- Q3971: Vanadium oxide
- Q3972: Vanadium (Ⅲ) sulfide
- Q3973: Sodium chromate
- Q3974: Cobalt(III) oxide
- Q3975: Hydroxy(oxo)cobalt
- Q3976: alpha-Nickel hydroxide
- Q3977: beta-Nickel hydroxide
- Q3978: Nickel(II) hydroxide
- Q3979: Hydroxy(oxo)nickel
- Q3980: Nickel Phosphorus Trisulfide
- Q3981: Copper;molecular oxygen
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- Q3983: Strontium
- Q3984: Oxoruthenium
- Q3985: Gold(I) chloride
- Q3986: Mercury
- Q3987: Lead(II) Bromide
- Q3988: Lanthanum
- Q3989: Cerium
- Q3990: Praseodymium
- Q3991: Thorium
- Q3992: Uranium