Language	Label	Description	Alias
English	Back pressure	-	-
Japanese	背圧	-	-

Language	English
Label	Back pressure
Description
Alias

Language	Japanese
Label	背圧
Description
Alias

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Q0: Others (Items with no parent or child)

Siblings:

• Q2: Resource
• Q3: National Institute for Materials Science
• Q4: Materials Data Platform
• Q5: DPF dictionary
• Q6: administrative dictionary
• Q7: materials dictionary
• Q8: properties dictionary
• Q9: characterization dictionary
• Q10: calculations dictionary
• Q11: structures dictionary
• Q12: instruments dictionary
• Q13: computers dictionary
• Q14: structural components dictionary
• Q15: processes dictionary
• Q16: miscellaneous dictionary
• Q17: units dictionary
• Q18: pressure
• Q19: pascal
• Q20: National Institute of Standards and Technology
• Q36: crystalographic structure
• Q41: license
• Q43: dummy dictionary
• Q50: chemical state
• Q53: qualitative analysis
• Q59: morphological analysis
• Q189: open-framework
• Q509: DPFC expansion of the Materials Data Vocabulary
• Q510: quantitative analysis
• Q511: surface analysis
• Q512: elemental analysis
• Q513: in vacuum
• Q514: Peak Center
• Q515: second
• Q516: unit of measurement
• Q518: quantity
• Q519: time
• Q520: unit of time
• Q521: data type
• Q522: string
• Q523: Data Collection System
• Q524: numeric
• Q525: ISO date time
• Q526: stress tensor
• Q527: stress
• Q529: rights statement
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• Q532: Creative Commons BY-SA Attribution-ShareAlike 4.0 International
• Q533: Creative Commons BY-ND Attribution-NoDerivatives 4.0 International
• Q534: Creative Commons BY-NC Attribution-NonCommercial 4.0 International
• Q535: Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
• Q536: Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International
• Q537: Creative Commons CC0 1.0 Universal
• Q538: Creative Commons Public Domain Mark 1.0
• Q539: Apache License 2.0
• Q540: GNU General Public License
• Q541: MIT License
• Q542: in atmosphere
• Q543: in liquid
• Q544: in inert gas
• Q545: crystal structure
• Q549: environment
• Q552: in vacuum
• Q553: in high pressure
• Q554: in magnetic field
• Q555: at low temperature
• Q556: polycrystal
• Q557: FCC particles on amorphous film
• Q558: characterization instruments
• Q559: microscope
• Q560: analytical electron microscope
• Q561: synthesis and processing instruments
• Q562: deposition and coating instruments
• Q563: spin coater
• Q643: biological property
• Q644: distribution
• Q645: electronic property
• Q646: environmental analysis
• Q647: failure analysis
• Q648: impurity analysis
• Q649: magnetic property
• Q650: optical property
• Q651: physical property
• Q652: theoretical simulation
• Q658: 散乱理論
• Q678: analysis field
• Q679: NIMS MDPF Common Messaging Format
• Q684: unit of measure
• Q688: crystallographic analysis
• Q694: copper(II) chloride
• Q716: XAFS DB Project in NIMS
• Q1863: RIKEN KEIKI Dataset Dictionary
• Q1881: NGC system registration law
• Q2839: Glow Discharge Mass Spectrometry
• Q3054: (test)スペクトル最適化
• Q3056: half width at half maximum
• Q3057: height
• Q3058: position
• Q3059: Lorentz-Gauss mixing ratio
• Q3060: area
• Q3519: Thermophysical Property Database Project in NIMS
• Q3623: Yb2O3
• Q3624: Ni-10at%Ti
• Q3625: Ni-60at%Ti
• Q3626: Y2O3
• Q3634: Starrydata vocabulary
• Q3694: Calcium sulfate Hydrous
• Q3695: Scotch tape
• Q3696: Sulfate green rust
• Q3697: Arsenic sulfide
• Q3698: Arsenic (III) oxide
• Q3699: Sodium selenite
• Q3700: Slawsonite
• Q3701: Monteponite
• Q3702: Europium(II) titanate
• Q3703: Europium(II) selenide
• Q3955: Nickel(II) hydroxide
• Q3970: Trivanesium tetrasulfide
• Q3971: Vanadium oxide
• Q3972: Vanadium (Ⅲ) sulfide
• Q3973: Sodium chromate
• Q3974: Cobalt(III) oxide
• Q3975: Hydroxy(oxo)cobalt
• Q3976: alpha-Nickel hydroxide
• Q3977: beta-Nickel hydroxide
• Q3978: Nickel(II) hydroxide
• Q3979: Hydroxy(oxo)nickel
• Q3980: Nickel Phosphorus Trisulfide
• Q3981: Copper;molecular oxygen
• Q3982: Gallium
• Q3983: Strontium
• Q3984: Oxoruthenium
• Q3985: Gold(I) chloride
• Q3986: Mercury
• Q3987: Lead(II) Bromide
• Q3988: Lanthanum
• Q3989: Cerium
• Q3990: Praseodymium
• Q3991: Thorium
• Q3992: Uranium
• Q4029: CPDDB Materials Type Dictionary
• Q4042: Sulfanylbenzoic acid
• Q4043: Arsenate
• Q4044: Arsenic acid
• Q4045: Arsonic acid
• Q4046: Arsenite
• Q4047: Iodate
• Q4092: Chromium(II) sulfide
• Q4094: Chromium(III) sulfate
• Q4096: Manganese(IV) disulfide
• Q4098: Chalcopyrite
• Q4107: Iron(III) phosphate dihydrate
• Q4109: Iron(III) pyrophosphate
• Q4110: Iron(III) sulfate
• Q4138: Monomethylarsonic acid
• Q4153: Selenium disulfide
• Q4179: 技術研究組合FC-Cubic
• Q4254: Loading amount
• Q4255: I/C ratio
• Q4256: Pt loading ratio
• Q4257: Electrolyte membrane thickness
• Q4258: Catalyst layer thickness
• Q4259: Water/Solvent ratio
• Q4260: Water/Alcohol ratio
• Q4261: Weight solid fraction
• Q4262: Volume solid fraction
• Q4263: Coating method
• Q4264: Number of coatings
• Q4265: Opening ratio
• Q4266: Material thickness
• Q4267: Blade gap
• Q4268: Cell area
• Q4269: Separator material
• Q4270: Flow channel shape
• Q4271: Rib width
• Q4272: Channel width
• Q4273: Flow channel length
• Q4274: Cell clamping pressure
• Q4275: Back pressure
• Q4276: Gas flow rate
• Q4277: Dew point
• Q4278: Humidifier temperature
• Q4279: Cell temperature
• Q4280: Gas
• Q4281: Relative humidity
• Q4282: Gas purge time
• Q4283: Hydrogen partial pressure
• Q4284: Oxygen partial pressure
• Q4285: Constant potential
• Q4286: Voltage range
• Q4287: Constant current
• Q4288: Constant voltage (current) hold time
• Q4289: Amplitude
• Q4290: Response
• Q4291: Current limit
• Q4292: Scan rate
• Q4293: Current range
• Q4294: Number of measurements
• Q4295: Gas utilization rate
• Q4296: Reference electrode
• Q4297: Conditioning
• Q4298: IV (Current-Voltage)
• Q4299: CV (Cyclic Voltammetry)
• Q4300: LSV (Linear Sweep Voltammetry)
• Q4301: ORR (Oxygen Reduction Reaction)
• Q4302: EIS (Electrochemical Impedance Spectroscopy)
• Q4303: COSV (Chronoamperometry with Step Voltage)
• Q4304: Load response durability test
• Q4305: Start-stop durability
• Q4306: OCV durability
• Q4307: Pressurized OCV durability
• Q4308: Dry-wet cycle durability
• Q4309: Evaluation device
• Q4310: Potentiostat/Galvanostat
• Q4311: Electronic load device
• Q4312: AC resistance meter
• Q4313: Viscosity Up, 30rpm
• Q4314: Viscosity Up, 60rpm
• Q4315: Viscosity Down, 30rpm
• Q4316: Viscosity Down, 60rpm
• Q4317: Particle size number median diameter
• Q4318: Particle size number average diameter
• Q4319: Loading amount
• Q4320: I/C ratio
• Q4321: Pt loading ratio
• Q4322: Electrolyte membrane thickness
• Q4323: Catalyst layer thickness
• Q4324: Water/Solvent ratio
• Q4325: Water/Alcohol ratio
• Q4326: Weight solid fraction
• Q4327: Volume solid fraction
• Q4328: Coating method
• Q4329: Number of coatings
• Q4330: Opening ratio
• Q4331: Material thickness
• Q4332: Blade gap
• Q4333: Cell area
• Q4334: Separator material
• Q4335: Flow channel shape
• Q4336: Rib width
• Q4337: Channel width
• Q4338: Flow channel length
• Q4339: Cell clamping pressure
• Q4341: Gas flow rate
• Q4342: Dew point
• Q4343: Humidifier temperature
• Q4344: Cell temperature
• Q4345: Gas
• Q4346: Relative humidity
• Q4347: Gas purge time
• Q4348: Hydrogen partial pressure