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Q2167: Time-Of-Flight Secondary Ion Mass Spectrometry

Vocabulary ID

http://matvoc.nims.go.jp/entity/Q2167

Language Label Description Alias
English Time-Of-Flight Secondary Ion Mass Spectrometry DICE instrument classification TOF-SIMS
Japanese 飛行時間二次イオン質量分析 DICE装置分類 TOF-SIMS
Language English
Label Time-Of-Flight Secondary Ion Mass Spectrometry
Description DICE instrument classification
Alias TOF-SIMS
Language Japanese
Label 飛行時間二次イオン質量分析
Description DICE装置分類
Alias TOF-SIMS