Q4007: セル評価条件
Vocabulary ID
http://matvoc.nims.go.jp/entity/Q4007
| Language | Label | Description | Alias |
|---|---|---|---|
| English | (No Label) | - | - |
| Japanese | セル評価条件 | - | - |
| Language | English |
|---|---|
| Label | (No Label) |
| Description | |
| Alias |
| Language | Japanese |
|---|---|
| Label | セル評価条件 |
| Description | |
| Alias |
Semantic Relatives
Parents
Children
- Q4210: Back pressure
- Q4211: Gas flow rate
- Q4212: Dew point
- Q4213: Humidifier temperature
- Q4214: Cell temperature
- Q4215: Gas
- Q4216: Relative humidity
- Q4217: Gas purge time
- Q4218: Hydrogen partial pressure
- Q4219: Oxygen partial pressure
- Q4220: Constant potential
- Q4221: Voltage range
- Q4222: Constant current
- Q4223: Constant voltage (current) hold time
- Q4224: Amplitude
- Q4225: Response
- Q4226: Current limit
- Q4227: Scan rate
- Q4228: Current range
- Q4229: Number of measurements
- Q4230: Gas utilization rate
- Q4231: Reference electrode