X-ray diffraction (Q3636)

From matvoc.nims.go.jp
Revision as of 05:28, 29 February 2024 by Kishimoto (talk | contribs) (‎Changed [ja] description: 物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。)
Jump to navigation Jump to search
No description defined
  • XRD
Language Label Description Also known as
English
X-ray diffraction
No description defined
  • XRD

Statements