{"entities":{"Q3636":{"pageid":3725,"ns":120,"title":"Item:Q3636","lastrevid":30667,"modified":"2024-02-29T05:28:40Z","type":"item","id":"Q3636","labels":{"ja":{"language":"ja","value":"X\u7dda\u56de\u6298"},"en":{"language":"en","value":"X-ray diffraction"}},"descriptions":{"ja":{"language":"ja","value":"\u7269\u8cea\u30fb\u6750\u6599\u306e\u69cb\u9020\u89e3\u6790\u624b\u6cd5\u306e\u4e00\u3064\u3067\u3001X\u7dda\u3092\u7167\u5c04\u3059\u308b\u3068\u73fe\u308c\u308b\u56de\u6298\u7dda\u3092\u3082\u3068\u306b\u3001\u7d50\u6676\u69cb\u9020\u3084\u5206\u5b50\u69cb\u9020\u3092\u8abf\u3079\u308b\u305f\u3081\u306e\u624b\u6cd5\u3002"},"en":{"language":"en","value":"One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays."}},"aliases":{"ja":[{"language":"ja","value":"X\u7dda\u7d50\u6676\u69cb\u9020\u89e3\u6790"},{"language":"ja","value":"X\u7dda\u56de\u6298\u6cd5"}],"en":[{"language":"en","value":"XRD"}]},"claims":{"P8":[{"mainsnak":{"snaktype":"value","property":"P8","hash":"a4d746d1edc814d01621b81efb1c0e391b70d9f1","datavalue":{"value":{"entity-type":"item","numeric-id":3608,"id":"Q3608"},"type":"wikibase-entityid"},"datatype":"wikibase-item"},"type":"statement","id":"Q3636$84a38433-4f63-5d71-d63d-973444ab794b","rank":"normal"}]},"sitelinks":{}}}}