Time-Of-Flight Secondary Ion Mass Spectrometry (Q2167)

From matvoc.nims.go.jp
Revision as of 08:02, 26 April 2022 by 142ef186-4a30-4d0a-a463-d09a02720cd5 (talk | contribs) (‎Created claim: Property:P40: Item:Q1979)
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to navigation Jump to search
DICE instrument classification
  • TOF-SIMS
Language Label Description Also known as
English
Time-Of-Flight Secondary Ion Mass Spectrometry
DICE instrument classification
  • TOF-SIMS

Statements

 
Retrieved from "https://matvoc.nims.go.jp/w/index.php?title=Item:Q2167&oldid=20972"