X-ray diffraction (Q3636): Difference between revisions
		
		
		
		
		
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 (Added [en] label:  X-ray diffraction)  | 
				 (Removed [ja] alias:  XRD)  | 
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XRD  | |||
| description / ja | description / ja | ||
物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。  | |||
| description / en | description / en | ||
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.  | |||
| Property / has broader | |||
| Property / has broader: Measurement methods / rank | |||
Normal rank  | |||
Latest revision as of 05:28, 29 February 2024
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
- XRD
 
| Language | Label | Description | Also known as | 
|---|---|---|---|
| English | X-ray diffraction  | 
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.  | 
  |