Difference between revisions of "X-ray diffraction (Q3636)"
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(Added [en] label: X-ray diffraction) |
(Removed [ja] alias: XRD) |
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| aliases / ja / 0 | aliases / ja / 0 | ||
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| aliases / en / 0 | aliases / en / 0 | ||
| + | XRD | ||
| description / ja | description / ja | ||
| - | + | 物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。 | |
| description / en | description / en | ||
| + | One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays. | ||
| Property / has broader | |||
| + | |||
| Property / has broader: Measurement methods / rank | |||
| + | Normal rank | ||
Latest revision as of 05:28, 29 February 2024
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
- XRD
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
X-ray diffraction
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One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
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