Difference between revisions of "X-ray diffraction (Q3636)"

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(‎Created a new Item: X線回折, 試料にX線を照射した際、X線が原子の周りにある電子によって散乱、干渉した結果起こる回折を解析する。)
 
(‎Removed [ja] alias: XRD)
 
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label / enlabel / en
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X-ray diffraction
aliases / ja / 0aliases / ja / 0
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XRD
aliases / en / 0aliases / en / 0
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XRD
description / jadescription / ja
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試料にX線を照射した際、X線が原子の周りにある電子によって散乱、干渉した結果起こる回折を解析する。
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物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。
description / endescription / en
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One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
Property / has broader
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Property / has broader: Measurement methods / rank
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Normal rank

Latest revision as of 05:28, 29 February 2024

One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
  • XRD
Language Label Description Also known as
English
X-ray diffraction
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
  • XRD

Statements