Difference between revisions of "X-ray diffraction (Q3636)"
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(Created a new Item: X線回折, 試料にＸ線を照射した際、Ｘ線が原子の周りにある電子によって散乱、干渉した結果起こる回折を解析する。) |
(Removed [ja] alias: XRD) |
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| label / en | label / en | ||
| + | X-ray diffraction | ||
| aliases / ja / 0 | aliases / ja / 0 | ||
| - | |||
| aliases / en / 0 | aliases / en / 0 | ||
| + | XRD | ||
| description / ja | description / ja | ||
| - | + | 物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。 | |
| description / en | description / en | ||
| + | One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays. | ||
| Property / has broader | |||
| + | |||
| Property / has broader: Measurement methods / rank | |||
| + | Normal rank | ||
Latest revision as of 05:28, 29 February 2024
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
- XRD
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
X-ray diffraction
|
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
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