X-ray diffraction (Q3636): Difference between revisions
Jump to navigation
Jump to search
(Added [en] label: X-ray diffraction) |
(Removed [ja] alias: XRD) |
||
(4 intermediate revisions by 2 users not shown) | |||
aliases / ja / 0 | aliases / ja / 0 | ||
aliases / en / 0 | aliases / en / 0 | ||
XRD | |||
description / ja | description / ja | ||
物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。 | |||
description / en | description / en | ||
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays. | |||
Property / has broader | |||
Property / has broader: Measurement methods / rank | |||
Normal rank |
Latest revision as of 05:28, 29 February 2024
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
- XRD
Language | Label | Description | Also known as |
---|---|---|---|
English | X-ray diffraction |
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays. |
|