Difference between revisions of "X-ray diffraction (Q3636)"
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(Created a new Item: X線回折, 試料にX線を照射した際、X線が原子の周りにある電子によって散乱、干渉した結果起こる回折を解析する。) |
(Removed [ja] alias: XRD) |
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label / en | label / en | ||
+ | X-ray diffraction | ||
aliases / ja / 0 | aliases / ja / 0 | ||
- | |||
aliases / en / 0 | aliases / en / 0 | ||
+ | XRD | ||
description / ja | description / ja | ||
- | + | 物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。 | |
description / en | description / en | ||
+ | One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays. | ||
Property / has broader | |||
+ | |||
Property / has broader: Measurement methods / rank | |||
+ | Normal rank |
Latest revision as of 05:28, 29 February 2024
One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
- XRD
Language | Label | Description | Also known as |
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English |
X-ray diffraction
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One of the methods for structural analysis of substances and materials to investigate crystal and molecular structures based on diffraction lines that appear when irradiated with X-rays.
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