X-ray diffraction (Q3636): Difference between revisions
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(Created claim: has broader (P8): Measurement methods (Q3608)) |
(Changed [ja] description: 物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。) |
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| description / ja | description / ja | ||
物質・材料の構造解析手法の一つで、X線を照射すると現れる回折線をもとに、結晶構造や分子構造を調べるための手法。 | |||
Revision as of 05:28, 29 February 2024
No description defined
- XRD
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | X-ray diffraction |
No description defined |
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