Difference between revisions of "Scanning Probe Microscope (Q1892)"
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(Created a new Item: 走査型プローブ顕微鏡, 先端RI(ARIM)装置分類) |
(Created claim: similar to item (P40): Scanning Probe Microscope (Q1926)) |
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| (4 intermediate revisions by one other user not shown) | |||
| label / en | label / en | ||
| + | Scanning Probe Microscope | ||
| description / en | description / en | ||
| + | ARIM instrument classification | ||
| Property / has broader | |||
| + | |||
| Property / has broader: Characterization Instrument / rank | |||
| + | Normal rank | ||
| Property / part of dictionary | |||
| + | |||
| Property / part of dictionary: ARIM Instrument Dictionary / rank | |||
| + | Normal rank | ||
| Property / similar to item | |||
| + | |||
| Property / similar to item: Scanning Probe Microscope / rank | |||
| + | Normal rank | ||
Latest revision as of 00:27, 28 April 2022
ARIM instrument classification
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Scanning Probe Microscope
|
ARIM instrument classification
|