Time-Of-Flight Secondary Ion Mass Spectrometry (Q2167): Difference between revisions
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(Created claim: part of dictionary (P11): DICE Instrument Dictionary (Q1883)) |
(Created claim: similar to item (P40): Time-Of-Flight Secondary Ion Mass Spectrometry (Q1979)) |
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| Property / similar to item | |||
| Property / similar to item: Time-Of-Flight Secondary Ion Mass Spectrometry / rank | |||
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Latest revision as of 08:02, 26 April 2022
DICE instrument classification
- TOF-SIMS
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Time-Of-Flight Secondary Ion Mass Spectrometry |
DICE instrument classification |
|