Time-Of-Flight Secondary Ion Mass Spectrometry (Q2167): Difference between revisions
Jump to navigation
Jump to search
(Changed an Item: Item created by hirosawa) |
(Created claim: similar to item (P40): Time-Of-Flight Secondary Ion Mass Spectrometry (Q1979)) |
||
| (2 intermediate revisions by the same user not shown) | |||
| Property / has broader | |||
| Property / has broader: Mass Spectrometer / rank | |||
Normal rank | |||
| Property / part of dictionary | |||
| Property / part of dictionary: DICE Instrument Dictionary / rank | |||
Normal rank | |||
| Property / similar to item | |||
| Property / similar to item: Time-Of-Flight Secondary Ion Mass Spectrometry / rank | |||
Normal rank | |||
Latest revision as of 08:02, 26 April 2022
DICE instrument classification
- TOF-SIMS
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Time-Of-Flight Secondary Ion Mass Spectrometry |
DICE instrument classification |
|