Scanning Probe Microscope (Q1926): Difference between revisions
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(Changed claim: has broader (P8): Characterization Instrument (Q1885)) |
(Created claim: similar to item (P40): Scanning Probe Microscope (Q1892)) |
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| Property / similar to item | |||
| Property / similar to item: Scanning Probe Microscope / rank | |||
Normal rank | |||
Latest revision as of 08:01, 26 April 2022
DICE instrument classification
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Scanning Probe Microscope |
DICE instrument classification |