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Showing below up to 50 results starting with #4,101.
- (Q658)
- theoretical simulation (Q652)
- physical property (Q651)
- optical property (Q650)
- magnetic property (Q649)
- impurity analysis (Q648)
- failure analysis (Q647)
- environmental analysis (Q646)
- electronic property (Q645)
- distribution (Q644)
- biological property (Q643)
- Auger electron spectroscopy (Q632)
- hollow structure (Q600)
- inorganic/organic hybrid (Q599)
- light-emitting device (Q597)
- quantum well (Q596)
- source/drain (Q595)
- two-dimensional electron/hole gas (Q594)
- trench (Q593)
- planar structure (Q591)
- heterostructure (Q590)
- electrode (Q589)
- metal-insulator-metal (Q588)
- metal-insulator-semiconductor (Q587)
- field-effect transistor (Q586)
- nanojunction (Q584)
- tunnel junction (Q583)
- p-n junction (Q582)
- superlattice (Q581)
- multilayer structure (Q580)
- barrier metal (Q569)
- optical measurement (Q566)
- MOS structure (Q564)
- spin coater (Q563)
- deposition and coating instruments (Q562)
- synthesis and processing instruments (Q561)
- analytical electron microscope (Q560)
- microscope (Q559)
- characterization instruments (Q558)
- FCC particles on amorphous film (Q557)
- polycrystal (Q556)
- at low temperature (Q555)
- in magnetic field (Q554)
- in high pressure (Q553)
- in vacuum (Q552)
- Other (Q551)
- Not available (Q550)
- environment (Q549)
- aging (Q548)
- nitride semiconductors (Q547)