Difference between revisions of "Atomic Force Microscope (Q2138)"
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(Created claim: has broader (P8): Scanning Probe Microscope (Q1926)) |
(Created claim: part of dictionary (P11): DICE Instrument Dictionary (Q1883)) |
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| Property / part of dictionary | |||
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| Property / part of dictionary: DICE Instrument Dictionary / rank | |||
| + | Normal rank | ||
Revision as of 05:29, 10 December 2021
DICE instrument classification
- AFM
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Atomic Force Microscope
|
DICE instrument classification
|
|