Difference between revisions of "Focused Ion Beam (Q2130)"
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(Changed an Item: Item created by hirosawa) |
(Created claim: has broader (P8): Sample Prepration (Q1924)) |
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| Property / has broader | |||
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| Property / has broader: Sample Prepration / rank | |||
| + | Normal rank | ||
Revision as of 05:28, 10 December 2021
DICE instrument classification
- FIB
| Language | Label | Description | Also known as |
|---|---|---|---|
| English |
Focused Ion Beam
|
DICE instrument classification
|
|